Scanning electron microscope LEO 1455VP (W cathode, SE and quadrant RE detector) and X-ray micro-range analysis (EDXS / GENESIS)

Technical specifications:

1. Microscope
• Imaging of top, ground or fractured surfaces of:
  • Starting materials (powder, fibres, films)
  • Materials, composites and composite materials
  • Coatings
  • Components
• Magnification range: 50x to approx. 10,000x
• Detectors:
  • Chamber detector for secondary electrons
  • Chamber detector for backscattered electrons
2. Energy dispersive X-ray microdomain analysis (EDXS) EDAX Genesis
• Local chemical analysis on flat surfaces:
  • for elements with order number Z ≥ 8
  • Detection limit approx. 0.5 wt.% for Z ≥ 11
  • Quantification error approx. 2 wt.% for main components
  • Species:
    • Average analysis
    • Phase analysis (for particle dimension > 1 µm)
    • Element concentration distribution along a straight line (linescan)
    • Two-dimensional element concentration distribution (mapping)

Research methodology (pdf-file - 380kb)

Examples