Field emission scanning electron microscope NEON40EsB with EDXS and EBSD

Technical specifications:

1. Microscope
• Imaging of top, ground or fractured surfaces of:
• Starting materials (powder, fibres, films)
• Materials, composites and composite materials
• Coatings
• Components
• Magnifications: 50x to several 100,000x
• Detectors:
• Chamber detector for secondary electrons
• Chamber detector for backscattered electrons
• Inlens detector for secondary electrons
• Inlens detector for backscattered electrons
• Bright and dark field detector for transmitted electrons
2. Energy dispersive X-ray microdomain analysis (EDXS) EDAX Genesis
• Local chemical analysis on flat surfaces:
• for elements with order number Z ≥ 8
• Detection limit approx. 0.5 wt.% for Z ≥ 11
• Quantification error approx. 2 wt.% for main components
• Species:
• Average analysis
• Phase analysis (for particle dimension > 1 µm)
• Element concentration distribution along a straight line (linescan)
• Two-dimensional element concentration distribution (mapping)
3. Backscattered electron diffraction (EBSD) EDAX TSL
• Grain orientation analysis, orientation mapping, texture analysis
• Identification of crystalline phases, phase mapping