rapid chemical identification and mapping of solids, thin films and biological samples

investigation of stress/strain and crystallinity in semiconductors and 2D materials

fast, fully confocal Raman imaging for process control or multi-user facilities

Spectral range: 50 - 4,000 cm⁻¹ (with one optical setting, no grating exchange)

Spectral resolution: ≤ 1.4 cm⁻¹ (FWHM, high-resolution setting) / 6.5 cm⁻¹ (standard)

Laser (internal): up to three simultaneously installed sources (typ. 532 nm, 638 nm, 785 nm) with automatic wavelength switching

Confocal performance: 0.5 µm lateral resolution; true pinhole depth discrimination