Jump to main content
Halbleiterphysik
Halbleiterphysik
Halbleiterphysik 

Accurion Nanofilm EP4

Contact:

Eugene Bortchagovsky

Application

  • Measurement of the first three rows of the Müller matrix

  • Measurement modes: zero ellipsometry or ellipsometry with rotating compensator

Specifications

  • angle of incidence: 40° - 90°

  • spectral range: 250 - 1700 nm

  • Spatial resolution: 1-2 µm

 

Social Media

Connect with Us: