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Chair of Materials and Surface Engineering
Materials and Surface Engineering

X-ray analysis

Universal X-ray diffractometer D5000 (Siemens)

  • Vertical circular goniometer with Bragg-Brentano focusing principle

Universal X-ray diffractometer D5000 (Siemens)

  • Horizontal four-axis goniometer with open  Euler cradle
  • Any XYZ sample positioning X = ±30 mm Y = ±25 mm Z ≤ 12 mm

X-ray diffractometer D8 DISCOVER (Bruker AXS)

  • Vertical goniometer in theta/theta configuration with centric Euler cradle for Bragg-Brentano and parallel beam geometry
  • Measurement positioning with laser video system