X-ray fluorescence spectrometer M4 TORNADO

The M4 TORNADO is an energy-dispersive X-ray fluorescence spectrometer for spatially resolved elemental analysis of elements with atomic numbers from 11 (sodium). The instrument can analyse a wide range of samples - from large inhomogeneous samples to the smallest particles. The M4 TORNADO is equipped with a fine-focus Rh X-ray tube (up to 50 kV, 300 μA) and a 1.0 mm collimator. Especially the measurement of light elements is done in vacuum (up to 20 mbar).

The fluorescence spectrum is measured with a Silicon Drift Detector (SDD). This 30 mm² SD detector ensures a very high energy resolution combined with excellent count rates, even at the high excitation intensities.

The associated software enables flexible and simple spectrum acquisition and evaluation via a graphical interface. The small spot size allows distribution analysis, which is supported by the TurboSpeed table and on-the-fly measurements. Data acquisition is done via HyperMap, which stores the complete spectrum for each pixel. This offers a wide range of possibilities for subsequent data analysis. Other measurement modes include point, multi-point and line scan. The special quantification package M-Quant enables accurate standard-free quantification for volume samples.

Technical specification

• Radiation-protected, large, evacuable sample chamber
• Motorised sample chamber door with EasyLoad function for fast sample handling
• Programmable fast motorised TurboSpeed X-Y-Z stage for sample positioning (stage speed up to 100 mm/s)
• Two video microscopes for displaying approx. 1 cm² and approx. 1 mm² sample size as well as the mosaic function allow sample viewing both in overview and for final positioning, fisheye camera for observing the sample space
• Excitation with an air-cooled Be-side window X-ray tube (anode: Rh)
• Optimisation of the stimulating radiation with up to 8 primary filters
• HV generator with max. 50 kV
• Detection of fluorescence radiation with SDD
• Detector area: 30 mm²
• Energy resolution: < 145 eV for Mn-Kα
• "On-the-fly" measurement for recording line or area scans

Sample requirements

• Sample mass maximum 7 kg
• Sample size maximum 270 × 240 × 120 mm³ (L × W × H)
• Coarse vacuum suitability of the sample for the analysis of light elements (up to sodium)
• Layer thickness < 30 µm for layer thickness determination

Examples of use:

• Measurement of element composition and layer thickness
• Single layers of Zn, Ni, Cr, Cu, Ag, Au, Sn etc.
• Measurement of light elements such as Na, Mg or P
• Binary alloy layers such as SnPb, ZnNi or NiP on Fe
• Ternary alloy layers such as AuCdCu on Ni
• Double coatings such as Au/Ni on Cu, Cr/Ni on Cu, Au/Ag on Ni, Sn/Cu on brass, etc.
• Dual layers, where one layer is an alloy layer (e.g. SnPb on Ni or Au on PdNi on bronze).
• Multilayers, metal alloys
• Analysis of the metal ion content in electroplating baths
• Measurement as point, multi-point, line scan or mapping