Equipment:
Structure: (Direct Imaging / Diffraction / Atomic and Molecular Structures)
OM | SG Tegenkamp | |
CLSM | SG Deibel | |
SEM | SG Tegenkamp | |
AFM | SG Zahn, SG Deibel, SG Magerle, SG Salvan, SG Seyller | |
STM | SG Tegenkamp, SG Seyller | |
LEEM / PEEM | SG Seyller | |
TEM | SG Tegenkamp | |
Profilometer | SG Seyller | |
LEED | SG Tegenkamp, SG Seyller | |
RHEED | SG Hellwig | |
SPALEED | SG Tegenkamp | |
XRD | SG Zahn, SG Hellwig | |
EXAFS | Beamline (Seyller) | |
NEXAFS | Beamline (Seyller) | |
Dichtefunktionaltheorie | SG Thränhardt, SG Gemming |