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Semiconductor Physics
ELECTRICAL CHARACTERIZATION

Electrical Characterization

Members
  • Dipl.-Ing. Axel Fechner
  •  

Former Members:

  • Dr. Franziska Lüttich, Dr. Daniel Lehmann,
    Dipl. Phys. Evelyn Breyer,
Topics
  • Fabrication and characterization of inorganic and organic as well as hybrid electrical devices (diodes, organic field-effect transistors (OFETs), organic solar cells)
  • Determination of organic sub- and monolayer modifications of barrier heights in Schottky diodes
  • Investigation on the influence of dopants and impurities on the behaviour of electrical devices
  • Electric field profiling of OFETs during operation (KPFM)
Equipment
  • Keithley and HP Source Measure Units for I/V and C/V Characterization in the pA range
  • Deep Level Transient Spectroscopy (DLTS)
  • Charge Transient Spectroscopy (QTS)
  • Anfatec AFM for Kelvin Probe Force Microscopy (KPFM) / potentiometry
  • ABET Solar Simulator Sun 2000 (AM 1.5)
  • Vacuum Chamber for In Situ Characterization
  • Oven up to 1600 °C

Press Articles