Equipment

At the professorship, there are numerous test benches and measuring devices available for research and education.

Aside from than the listed devices and test benches here, further possibilities are being provided to us in collaboration with our partners to be able to offer a variety of investigations in the field of research and as a service provider.

Overload investigations and dynamic characteristics

Test bench for short circuit and switching characterization

Test bench for high voltages up to 6 kV
	Feasible Measurements	Short-Circuit (I,II,III) | Double Pulse | frequent Switching
	Technische Highlights	Intermediate circuit voltage up to 6 kV possible Variable parasitic inductances through flexible setups Measurements at room temperature and at increased temperatures possible Measurements with up to 4 channels, 12Bit, 2 GHz and 2,5 GSa possible Reliable measurement of power devices on DCB substrate Control system and safety precautions ensure executing without possible personal injuries.

Power cycling test benches

Overview of the available power cycling test benches
	Feasible Measurements	Accelerated lifetime investigations| Thermal impedance measurements
	Technical Highlights	15 test benches available Up to 2000 A possible Flexible programming and measuring of relevant parameters due to desired test strategy Felixble measurement time periods and measurement delays Modular and adaptable setup for every package Measurements of up to 15 devices simultaneously Passive and active switching in power cycling possible Constant increase in possibilities in the planning: Automated threshold voltage measurement Digital control and monitoring of gate voltage Monitoring of heatsink flow through

Reliability Investigations

Gate-Stress-Tests

Gate-Stress-Test - HTGB
	Feasible Measurements	Stepped Gate-Stress-Tests
	Technical Highlights	Automatic and online Gate-leakage-current measurement Free programmable steps Measurement of 100 devices at once possible

High Temperature Reverse Bias - HTRB

High temperature reverse bias - HTRB
Feasible Measurements	High Temperature Reverse Bias - HTRB
Technical Highlights	Continuous leakage-current measurment Testcondition at 150°C Test with 80V or up to 6,5kV Maximum 20 devices under test (dependent on module size)

High humidity, high temperature, high voltage reverse bias test - H3TRB

High humidity, high temperature, high voltage reverse bias test - H3TRB
Feasible Measurements	High humidity, high temperature, high voltage reverse bias test - H3TRB
Technical Highlights	Continuous leakage-current measurment Testcondition at 80°C and 85% relative humidity Test with 80V or up to 6,5kV Maximum 20 devices under test (dependent on module size)

Failure Analysis

Quantitative bond wire tester

Quantitative bond wire tester
	Feasible Measurements	Bond wire pluck test with qualitative and quantitative significance
	Technical Highlights	Adjustment to different types of cases possible Precise digital measurement with a resolution of 0.01 N

Microscope

Microscope
	Feasible Measurements	Defect image analysis | Inspection of aging signs
	Technical Highlights	Digital editing and creating of panoramic images Creating of 3D-depths images Magnification with zoom up to 2500 times

Ultra Sonic Microscopy

Ultra Sonic Microscopy
	Feasible Measurements	Non-destructive failure investigation | Detektion of traces of ageing and damages
	Technical Highlights	Different resolutions and penetrations with different high frequency probes Various scanning modes enable investigations for different room regions (vertical, horizontal, tilted) Programmable control and automatic localization enable high reproducability Predesigned assambly for all commercially available power electronic packages