Technical Equipment
Composites
4-point resistance measurement
Device: Jandel RM 5000 with ceramic flat heater
Specifications:
- Surface resistance range: 1 mΩ/□ (10-3) up to 5 x 108 mΩ/□ with 0,3 % accuracy
- constant measuring current between 10 nA and 99.999 mA,
- constant measuring voltages from 0.01 mV to 1250 mV
- For volume (bulk) resistance measurement, the specified range is 1 mΩcm up to 1*106 Ωcm
- Input impedance 1,000,000,000,000 ohms
- Input bias current 4 pA
- DVM 1300 mV and 130 mV range
- Maximum contact pressure 0.3 N.
- Center distance 1mm, Rµ = 500 µm
Applications:
- Non-destructive and invasion-free determination:
- of the sheet resistance of planar solids
- Determination of the specific resistance for certain or known layer thicknesses
- Determination of the temperature coefficient at temperatures between 35–500 ° C
- Standard measuring method for determining the electrical conductivity in semiconductor technology, photovoltaics etc.
Temperature layer resistance measurement of various Ni-C layers as well as determined TCR values
Contact Person
Dr.-Ing. Maik Trautmann
- Telefon:+49 371 531-38846
- Fax:+49 371 531-838846
- Raum:3, 3/A104
- E-Mail:
