Technical Equipment
Composites
Laser scanning microscopy
Device: VK X200 from KEYENCE
specifications:
- Measured variables: profile, areas, volume, wear and height differences
- Sample requirements: horizontal position of the test area in a clean, dust-free condition
- Measuring range: 10x, 20x, 50x, 150x
- Resolution: 0.0005 µm (height) 0.001µm (width)
- High-resolution color observations without preparation of the measurement object
- High-resolution images and great depth of field
- Non-destructive profilometry and roughness measurements
- Fast 3D color images
Applications:
- Mapping of material surfaces and prepared surfaces, quantitative characterization of the topography with high resolution, especially in the z direction
- Non-contact 3D measuring system performs profile, roughness and thickness measurements in the nanometer range on almost any material
Contact Person
Dr.-Ing. Maik Trautmann
- Telefon:+49 371 531-38846
- Fax:+49 371 531-838846
- Raum:3, 3/A104
- E-Mail:
