Technical Equipment
Microstructure analysis, material analysis and material characterization
HITACHI H8100 transmission electron microscope with EDAX GENESIS X-ray microscope analysis
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Examination of thinned sample areas (remaining thickness 30 - 300 nm) in transverse or cross-section of:
- Materials, composite materials and composite materials
- coatings
- Magnifications: 5,000x to 200,000x
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Statements about:
- Crystallite size, shape, orientation
- Lattice defects, phase identification
- State of internal interfaces
- Spatial resolution of fine area electron diffraction: approx. 500 nm
- Spatial resolution of the X-ray micro-range analysis: approx. 50 nm
→ see also Analytical Scanning Electron Microscopy service
Contact Person
M. Sc. Andreas Gester
- Telefon:+49 371 531-33649
- Fax:+49 371 531- 833649
- Raum:3, 3/E001
- E-Mail:
