Image Processing Based Insulator Fault Detection Method

Uranchimeg Tudevdagva | Batbayar Battseren | Wolfram Hardt | Galina V. Troshina

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November 2018

Typ	Article
Quelle	2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) S. 579 - 583
Einrichtung	Technische Hochschule Ingolstadt Zentrum für Angewandte Forschung (ZAF) Esplanade 10 85049 Ingolstadt
ISBN	978-1-5386-7054-5
ISSN	2473-8573
Link	ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8545429&isnumber=8545018
Bibtex	Anzeigen @Article{UrTuBaBaWoHaGaV.Tr18,      author       = {Uranchimeg Tudevdagva, Batbayar Battseren, Wolfram Hardt, Galina V. Troshina},      title        = {Image Processing Based Insulator Fault Detection Method},      organization = {Technische Hochschule Ingolstadt Zentrum für Angewandte Forschung (ZAF)},      pages        = {579--583},      url          = {http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8545429&isnumber=8545018},      month        = {November},      year         = {2018},      isbn         = {978-1-5386-7054-5},      issn         = {2473-8573},      journal      = {2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)}, }