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Semiconductor Physics
NANOSCALE CHARACTERIZATION

Nanoscale Characterization

Members
  •  
  • M.Sc.Jana Kalbáčová

Former Members:

  • Dr. Raul David Rodriguez, M.Sc. Evgenia Sheremet, B.Sc. Susanne Müller
Topics
  • Tip- and surface-enhanced Raman spectroscopy (TERS and SERS); Plasmonic nanostructures; Nano-optics
  • Quantum dot structures
  • Characterization of carbon nanotube nanostructures and devices
  • Two-dimensional nanomaterials: graphene, gallium selenide, molybdenum disulfide, and other layered compounds
  • Novel scanning probe techniques
  • Custom made probes; Finite element method simulations (FEM) of plasmonic and mechanical properties of AFM probes; FEM simulations of TERS
    and SERS configurations
  • Numerical simulations of dynamic AFM
Equipment
  • Atomic force microscopy, Kelvin probe force microscopy, current sensing AFM; temperature dependent capabilities
  • Tip- and surface-enhanced Raman spectroscopy (TERS and SERS)
  • ANSYS: finite element simulation package

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