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Semiconductor Physics

Electron Spectroscopy


Former Members:

  • Dr. Volodymyr Dzhagan, Dr. Daniel Lehmann, Dr. Francisc Haidu,
    M.Sc. Ghazal Tofigi,
  • Material characterization and chemical interaction of interfaces (XPS)
  • Ultra-high vacuum studies of growth and electronic properties of various organic films (e.g. perylene derivatives, phthalocyanines) on various substrates (GaAs, Si) (XPS and UPS)
  • Determination of the electronic structure of solids surfaces, thin films, and relevant interfaces via inspection of valence and conduction bands (UPS and IPES)
  • Determination of band offsets as well as HOMO (UPS) and LUMO levels (IPES) of organic films
  • Angle-resolved characterization permits the mapping of band structure in k-space (UPS)
  • Near Edge X-ray Absorption Fine Structure (NEXAFS) investigations at the electron storage ring BESSY II
  • ARUPS 10 for UV Photoemission Spectroscopy (UPS) and Inverse Photoemission Spectroscopy (IPES)
  • MUSTANG for X-ray Photoemission Spectroscopy (XPS)

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