1 Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Autoren: Sheremet, Evgeniya; Meszmer, Peter; Blaudeck, Thomas; Hartmann, Susanne; Wagner, Christian; Ma, Bing; Hermann, Sascha; Wunderle, Bernhard; Schulz, Stefan E.; Hietschold, Michael; Rodriguez, Raul D.*; Zahn, Dietrich R. T.
Quelle: In: Physica Status Solidi. A. - Wiley. - 216. 2019, 19, 1970061
Erscheinungsjahr: 2019
ISBN/ ISSN: 1862-6319