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VERSION:2.0
PRODID:TU Chemnitz
METHOD:PUBLISH
X-WR-CALNAME:Veranstaltungen der TU Chemnitz
X-WR-TIMEZONE:Europe/Berlin
BEGIN:VEVENT
CLASS:PUBLIC
DTSTART;TZID="Europe/Berlin":20051124T150000
DTEND;TZID="Europe/Berlin":20051124T163000
LOCATION:Reichenhainer Str. 90\, Chemnitz (Zentr. Hörsaal- und Seminargebäude)
SUMMARY:Kolloquium des Sonderforschungsbereiches 379 "Mikromechanische Sensor- und Aktorarrays": "Local materials inhomogeneities - cause for reliability issues in microsystems ? " (Fakultät für Elektrotechnik und Informationstechnik\, Zentrum für Mikrotechnologien)
DESCRIPTION:Distributions in grain size\, orientation and yield stresses lead to local inhomogeneities in polycrystalline metallic systems. Reliablility in microsystems and microelectronics can be limited by failure due to electromigration\, stress and fatigue.\nProf. Ralph Spolenak\, ETH Zürich\, Dept. of Materials\, Laboratory for Nanometallurgy\nDr. Seckel\, 0371-531 3261
ORGANIZER:MAILTO:Wolfgang.Seckel@zfm.tu-chemnitz.de
UID:6842@www.tu-chemnitz.de
CREATED:20051115T125200Z
DTSTAMP:20210802T195637Z
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