- Author(s):
- M. Fronk, C. Schubert, F. Haidu, C. Scarlat, K. Dörr, M. Albrecht, D.R.T. Zahn, G. Salvan
Source:- IEEE Transactions on Magnetics, 48 (11) (2012) 2777
Title:- Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-optical Kerr Effect Spectroscopy
Abstract:- ---
Type of Publication:- Refereed Journal
Year:- 2012
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