- Author(s):
- F. Seidel, M. Fronk, C. Himcinschi, V. Chis, D.R.T. Zahn
Source:- Phys. stat. sol. (c) 7 (2) (2010) 222
Title:- Spectroscopic Ellipsometry and Reflection Anisotropy Spectroscopy of Lutetium Diphthalocyanine Films on Silicium
Abstract:- ---
Type of Publication:- Refereed Journal
Year:- 2010
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