- Author(s):
- E. Sheremet, A. Milekhin, R.D. Rodriguez, D. Dmitriev, A. Toropov, A. Gutakovskii, D. Dentel, W. Grünewald, M. Hietschold, D.R.T. Zahn
Source:- Material Research Express 2 (2015) 035003
Title:- Raman, AFM, and TEM Profiling of QD Multilayer Structures
Abstract:- ---
Type of Publication:- Refereed Journal
Year:- 2015
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