4-tip probe techniques became very popular within the last years and have demonstrated their capability to address important physical and chemical aspects. Compared to conventional, i.e .lithographically driven concepts, the 4-tip STM technique can directly contact delicate nanostructures with uttermost precision and variable contact spacings and geometries. Together with the STM, STS, and potentiometry capabilities, an almost complete set of information with respect to the atomic structure, electronic states, and conductivity can be gathered in-situ without the need of elaborative transfers. This workshop aims to bring together the experts in the field of 4-tip STM surface transport measurements, as well as researchers interested in this new technique. The participants will present their latest results on nanoscale charge transport, obtained with multi-tip techniques. Also, common experimental issues and aspects of the data analysis which occur for this new technique will be discussed in a technical session.