- Author(s):
- F. Haidu, O. Gordan, D. Makarov, M. Albrecht, C. Cobet, N. Esser, M. Kehr, W. Hoyer, D.R.T. Zahn
Source:- 3rd NanoCharm School on Ellipsometry, 27.02. - 05.03. 2010, Salzburg, Austria
Title:- Spectroscopic Ellipsometry Studies of Co/Cu Multilayers on Silicon
Abstract:- ---
Type of Publication:- Posters
Year:- 2010
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