- Author(s):
- C. Himcinschi, M. Friedrich, S. Frühauf, S.E. Schulz, T. Geßner, D.R.T. Zahn
Source:- Thin Solid Films, 455-456 (2004) 433
Title:- Contributions to the Static Dielectric Constant of Low-k Xerogel Films Derived from Ellipsometry and IR Spectroscopy
Abstract: (visitor access)- /physik/HLPH/publications/p_src/452a.pdf
Type of Publication:- Refereed Journal
Year:- 2004
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