- Author(s):
- S.D. Silaghi, M. Friedrich, R. Scholz, T.U. Kampen, C. Cobet, N. Esser, W. Richter, W. Braun, D.R.T. Zahn
Source:- Thin Solid Films, 455-456 (2004) 505
Title:- Vacuum Ultraviolet Spectroscopic Ellipsometry Investigations of Guanine Layers on H-Passivated Si(111) Surfaces
Abstract: (visitor access)- /physik/HLPH/publications/p_src/448a.pdf
Type of Publication:- Refereed Journal
Year:- 2004
|
|