Technical equipment in the chair of Solid Surfaces Analysis

Please don't hesitate to contact us in the case you feel, that your problem could be solved using our methods and our equipment.

1) Electron Microscopy

Electron Microscopy is operated in the Electron Microscopy Lab of the Institute of Physics. There is the following equipment:

Electron Microscopes:

• 200kV-High Resolution Transmission Electron Microscope (HRTEM) Philips CM 20 FEG, with an Imaging Energy Filter from Gatan (GIF)




• Scanning Elektron Microscope NanoNovaSEM (Philips) with Schottky Field Emission Gun, and analytical Detectors for:
• Backscattered electrons
  
• X-ray Microanalysis (EDX)
• Electron Backscattering Diffraction (EBSD)
• Cathodolumineszence

• Scanning Elektron Microscope Philips SEM 515
  

Equipment for the Preparation of Cross Section HRTEM samples:

• grinding machines, High vacuum sputtering and evaporation, Ball grinder, Diamond wire saw etc.
• Ion milling system BAL-TEC RES 010

2) Scanning Probe Microscopies

• UHV-Surfacelab (OMICRON) with in-situ preparation, Low temperature scanning tunneling microscope (STM) and LEED
• Environmental Scanning Tunneling Microscope (Burleigh ISTM)
• Atomic Force Microscope (Burleigh)
• Scanning Electrical Force Microscope (SEFM) (Extension of TopoMetrix AFM)

Completed instrumental developments:

• Scanning Tunneling Microscope of Besocke type (Home made)
• Ballistic Electron Emission Microscope (BEEM)
• Ambient STM
  
• NC-AFM for simultaneous Operation of Cantilever-Arrays

3) Light Microscope

• Digital Microscope VHX-500 from Keyence
  

 

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