AT LAST, an EELS and XAS fine structure database exists at

The aim is to provide an extensive reference data collection.

This database is a compilation of outer-shell and inner-shell excitation spectra from EELS and X-ray investigations, which will form a catalog of fine structures for materials. It allows anyone to download spectra or to submit data.

The database will be in continual development (data will be updated), and, during the next six months, depending on your remarks, the presentation may be modified. Please feel free to send any question or idea to eelsdb@cemes.fr (or to sikora@lps.u-psud.fr or to serin@cemes.fr).

Data can be submitted automatically via Internet. The parameters of the spectra will be checked before incorporation of the data in the web site. All spectra are welcome, whatever their quality (energy resolution, signal to noise ratio,...). The justification for this is that both high and modest energy resolution information can be useful if these spectra exhibit changes in the fine structure.

Conditions of submission:
EELS:
 - Raw data are for the moment preferred (no background subtraction, no plural scattering deconvolution or resolution sharpening. Dark current or gain variation correction is OK). Treated data are accepted when processing permits hidden features to be revealed. Details about the processing are required.
 - Gatan-ELP binary or 2-column Ascii format
 - For core edges, reduced thickness: 0.2 < t/lambda < 0.7.
 - For outer shells (low-loss domain), reduced thickness: 0.3 < t/lambda < 1 in order to offer features
 with optimised intensity.
 - Associated low-loss data, recorded from the same area and in the same conditions (convergence angle, mode, probe size, spectrometer aperture) can also (and should) be submitted to offer users the possibility to correct for thickness effects, when the single scattering profile is needed). You must then submit the low loss data before the core-loss data.
X-Ray:
 - 2-column Ascii

Some parameters are required, some others are optional.
Set of EELS required parameters: Specimen name, Formula, Microscope, Mode, Detector, Gun type, Convergence semi-angle, Objective aperture, Incident beam energy, Collection semi-angle.